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Measuring Microscope Nikon
high precision measurement, ease of use, and flexible scalability.
Combinations can be chosen to meet specific needs, such as height measurement and large sample measurement. A measuring microscope that can be used to measure parts in a variety of industries, including electronic components, resin-molded products, metal processing components and tools.
■main features
・achieve precise measurements
robust construction ensures long-term, highly accurate and repeatable measurement results. due to its high rigidity, can support to mount a stage with *300×200mm stroke. only for *MM-800.
・high scalability with various accessories
a wide range of accessories are available. the right accessory combination ensures an efficient and optimal measuring process.
・interface that enables communication with external devices
system control and data processing of measurement results can be performed on software by communicating with the E-MAX measurement support system. important lighting conditions for image measurement can be saved, reducing human error.
・focus aid for improve height measurement accuracy（FA）
the clear pattern allows for precise focusing on the Z-axis and reduces height measurement errors caused by the objective lens's focal depth. depending on the sample, you can choose between 2 types of light and dark patterns.
・achieve precise measurements
robust construction ensures long-term, highly accurate and repeatable measurement results. due to its high rigidity, can support to mount a stage with *300×200mm stroke. only for *MM-800.
・high scalability with various accessories
a wide range of accessories are available. the right accessory combination ensures an efficient and optimal measuring process.
・interface that enables communication with external devices
system control and data processing of measurement results can be performed on software by communicating with the E-MAX measurement support system. important lighting conditions for image measurement can be saved, reducing human error.
・focus aid for improve height measurement accuracy（FA）
the clear pattern allows for precise focusing on the Z-axis and reduces height measurement errors caused by the objective lens's focal depth. depending on the sample, you can choose between 2 types of light and dark patterns.
