We have released various types of FT-IR that boast high resolution and high sensitivity, as well as various accessory devices such as an infrared microscope unit that pursues automation.
These are used for qualitative analysis of defect locations on minute parts (IC chips, etc.) in the electronics, electrical, and semiconductor fields, as well as for various structural analysis and nondestructive measurement. It has earned a high reputation.
Ho Chi Minh Head Office
Tel: (+84)28-3512-0921
■Yazu
Mobile: (+84)90-2863-353
Email: yazuk@ryokosha.co.jp
■Mai
Mobile: (+84)90-2787-971
Email: Vu_Thi_Hoang_Mai@ryokosha.co.jp
Ha Noi Office
Tel: (+84)-24 3795 7130
■Fukuda
Mobile: (+84)90-9775-637
Email: hiroyasu_fukuda@ryokosha.co.jp
■Quyen
Mobile: (+84)90-3003-043
Email: Tran_Thi_Le_Quynh@ryokosha.co.jp
■Do
Mobile: (+84)93-4130-838
Email: Nguyen_Van_Do@ryokosha.co.jp