Fourier Transform Infrared Spectroscopy (FT-IR) SHIMADZU

We have released various types of FT-IR that boast high resolution and high sensitivity, as well as various accessory devices such as an infrared microscope unit that pursues automation.

These are used for qualitative analysis of defect locations on minute parts (IC chips, etc.) in the electronics, electrical, and semiconductor fields, as well as for various structural analysis and nondestructive measurement. It has earned a high reputation.

■model number lineup
IRSpirit

IRAffinity-1S

■main features
・space-saving and highly expandable. Can be installed even in a small space.
・large sample chamber in a small body (body is less than A3 size).
・easy to use by anyone with easy navi by IR Pilot.
・high stability and throughput.
・high reliability due to moisture-resistant design.
・self-diagnostic function.

■main specifications
・Interferometer: Michelson interferometer (30°incident angle) Equipped with Dynamic Alignment system Sealed interferometer
・Beam splitter:Germanium-coated KBr
・Light source:High-energy ceramic light source
・Detector
IRSpirit-T model: DLATGS detector with temperature control
IRSpirit-L model: LiTaO3 detector
・Wavenumber range:7,800 to 350 cm-1
・Resolution:0.9, 2, 4, 8, 16 -1
・Dimensions:390 (W) x 250 (D) x 210 (H) mm
・Weight:8.5kg